IES Webinar ANSI/IES LM-85-23 for LED Product Design
May 15, 2025 | 12:00 pm - 1:00 pm ET
With ANSI/IES LM-85-23 Approved Method: Optical and Electrical Measurements of LED Sources, optical measurements are now tied to junction temperature, eliminating a significant error source. LED measurements will now be more consistent and repeatable. But how is LM-85-23 really applied when considering LED product design? What are the short-term and long-term benefits?
Registration for this event ends on May 15, 2025 at 12pm ET.
SPEAKER
Jeff Hulett is the CTO and founder of Vektrex, a leading provider of high-performance LED and laser solutions.
As the chief designer of Vektrex’s award-winning Precision Pulsed Source Measure Unit, Hulett has played a pivotal role in advancing LED testing technology.
He is an active participant in industry standards development, serving as chair of the Illuminating Engineering Society’s LM-80 working group and secretary of the IEEE UV-LED Datasheet Standard working group. He has also contributed significantly to the CIE’s TC2-91 group and the IES’s LM-85-23 and LM-92-22 working groups.
Hulett holds multiple patents related to LED testing and has authored or coauthored numerous technical articles published in LEDs Magazine, Photonics Spectra, LED Professional, and the NIST Research Journal. He earned a BSEE from the Illinois Institute of Technology. His expertise and innovations have shaped the industry, with his Precision Pulsed Source/Measure Unit playing a key role in generating many of the graphs featured in LM-85 and LM-92.
